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International Journal of Physics and Applications
Peer Reviewed Journal

Vol. 6, Issue 2, Part C (2024)

Ionization cross section of Cho by electron impact using mass spectrometer

Author(s):

Praveen Bhatt and Neeru Kundu

Abstract:

The theoretical model, developed by S. P. Khare, has been modified to evaluate the total cross-section for ionization of Formaldehyde (CHO) due to electron impact. The incident electron energy range varies from the ionization threshold to 3100 eV, covering both low-energy and high-energy interactions. The modifications to the existing theoretical framework incorporate recent advancements in quantum mechanical calculations, ensuring improved accuracy in predicting ionization probabilities. The calculated cross-sections have been compared with available experimental data and show a strong correlation, validating the reliability of the modified model. The inclusion of Born approximation, semi-empirical corrections, and distorted-wave methods enhances the predictive capabilities of the theoretical approach. Furthermore, a detailed analysis of secondary electron emissions, energy loss mechanisms, and resonance structures has been conducted to provide insights into the underlying physics of electron-molecule collisions. This research contributes significantly to the fundamental understanding of electron-molecule interactions, which is crucial in fields such as plasma physics, radiation chemistry, and atmospheric modeling. The findings are particularly relevant for aerospace applications, astrophysical environments, and industrial plasma processing, where electron-driven molecular ionization plays a vital role. Future work will involve refining the model for polyatomic molecules and extending the study to dissociative ionization channels to further enhance the applicability of theoretical predictions.

Pages: 209-215  |  85 Views  31 Downloads


International Journal of Physics and Applications
How to cite this article:
Praveen Bhatt and Neeru Kundu. Ionization cross section of Cho by electron impact using mass spectrometer. Int. J. Phys. Appl. 2024;6(2):209-215. DOI: 10.33545/26647575.2024.v6.i2c.136
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